Superresolving masks for incoherent high-numerical-aperture scanning microscopy in three dimensions

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Akduman I., BRAND U., GROCHMALICKI J., HESTER G., PIKE R., BERTERO M.

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, vol.15, no.9, pp.2275-2287, 1998 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 15 Issue: 9
• Publication Date: 1998
• Doi Number: 10.1364/josaa.15.002275
• Journal Name: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.2275-2287
• Istanbul Technical University Affiliated: No

Abstract

A singular-value-decomposition analysis of the imaging kernel for three-dimensional fluorescent laser scanning microscopy at a high numerical aperture (NA) is presented. The design and superresolving performance of image-plane binary optical masks are then derived, and new computational techniques for calculating these masks are given. Initial experimental results with a microscope equipped with such a mask at NA = 1.3 are presented. The improvement in both contrast and resolution over the confocal and type 1 instruments is demonstrated. (C) 1998 Optical Society of America.