Genetic Defect Based March Test Generation for SRAM

Di Carlo S., Politano G., Prinetto P., Savino A., Scionti A.

Conference on EvoApplications 2011: EvoCOMPLEX, EvoGAMES, EvoIASP, EvoINTELLIGENCE, EvoNUM, AND EvoSTOC, Torino, İtalya, 27 - 29 Nisan 2011, cilt.6625, ss.141-150 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası: 6625
  • Basıldığı Şehir: Torino
  • Basıldığı Ülke: İtalya
  • Sayfa Sayıları: ss.141-150
  • İstanbul Teknik Üniversitesi Adresli: Hayır

Özet

The continuos shrinking of semiconductor's nodes makes semiconductor memories increasingly prone to electrical defects tightly related to the internal structure of the memory. Exploring the effect of fabrication defects in future technologies, and identifying new classes of functional fault models with their corresponding test sequences, is a time consuming task up to now mainly performed by hand. This paper proposes a new approach to automate this procedure exploiting a dedicated genetic algorithm.