Energy dissipation in atomic force microscopy and atomic loss processes


Hoffmann P., JEFFERY S., PETHICA J., Ozer H. Ö. , ORAL A.

PHYSICAL REVIEW LETTERS, cilt.87, 2001 (SCI İndekslerine Giren Dergi) identifier identifier

Özet

Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultrasmall amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10-100 meV per cycle. This dissipation is likely due to the motion of a bistable atomic defect in the tip-surface region. In the contact regime we observe dc hysteresis associated with nanoscale plasticity. We find the hysteretic energy loss to be 1 order of magnitude higher for a silicon surface than for copper.