Modification of optical constants at nanospherical ZnO:Al thin film

Urper O., Tonka M., Baydogan N.

JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS, cilt.34, sa.4, ss.1-6, 2023 (SCI-Expanded) identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 34 Sayı: 4
  • Basım Tarihi: 2023
  • Doi Numarası: 10.1007/s10854-022-09751-z
  • Dergi Adı: JOURNAL OF MATERIALS SCIENCE: MATERIALS IN ELECTRONICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus, Aerospace Database, Applied Science & Technology Source, Chemical Abstracts Core, Communication Abstracts, Compendex, Computer & Applied Sciences, INSPEC, MEDLINE, Metadex, Civil Engineering Abstracts
  • Sayfa Sayıları: ss.1-6
  • İstanbul Teknik Üniversitesi Adresli: Evet

Özet

The details in the refractive index and the extinction coefficient have been determined as the modification of the optical constants had great importance to solve the adulteration problems of the thin film solution at the synthesis and coating processes of the ZnO:Al thin films (prepared using the sol–gel dip technique). The detailed examination of the refractive index has provided an understanding of the significance of the stability of the chemical composition of the thin film and the effect of the sol–gel solution on its optical model. The supervision of the post coating process has provided more efficient control of the bending of light after the coating process. After the reproducibility of the thin film was performed at the same optical characteristics the control of UV absorption has indicated that the thin film annealed in nitrogen ensured the optimum absorption at the blueshift region. Hence, the optical constants have been compared sensitively to determine the ideal refractive index and low extinction coefficient of the thin film to avoid the change of refractive index by the heating of film.