RESIDUAL STRESS AND MICROSTRUCTURE OF YSZ BUFFER LAYERS FOR YBCO COATED CONDUCTOR

BULUT O., Dönmez A., BAYTAK T., Tosun M., İPEK C., ATAOĞLU Ş., ...More

20th International Research/Expert Conference”Trends in the Development of Machinery and Associated Technology” TMT2016, 24 September - 01 October 2016

  • Publication Type: Conference Paper / Full Text
  • Istanbul Technical University Affiliated: Yes