The acrylamide/N,N'-methylenebisacrylamide gelation process was studied by time dependent measurement of real epsilon(I) and imaginary epsilon(II) parts of the complex dielectric permittivity. The measurements were carried out in the frequency interval 500 Hz to 13 MHz. Strong relaxation behavior of epsilon(I) and epsilon(II) was observed in all dielectric spectra during the transformation from the sol to the gel state. At all frequencies a maximum in the imaginary part of dielectric constant epsilon(II) was observed. The gel point was found by extrapolating this maximum to zero frequency. The behavior of epsilon(I) and epsilon(II) related to the gelation mechanism is discussed. (C) 2000 John Wiley & Sons, Inc.