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Kuntman A., Ardali A., Kuntman H., Kacar F.
SOLID-STATE ELECTRONICS, vol.48, no.2, pp.217-223, 2004 (SCI-Expanded)
Article / Article
Science Citation Index Expanded (SCI-EXPANDED), Scopus
Istanbul Technical University Affiliated:
The importance of long term reliability in MOS VLSI circuits is becoming an important subject because of the increasing densities of VLSI chips. Hot carrier effects cause noncatastrophic failures which develop gradually over time and change the circuit performance.