INVESTIGATION OF ELECTRICAL PROPERTIES OF CIGS THIN FILMS DERIVED BY SOL-GEL PROCESS


Baydogan N., Canci U., Akyol S., Cimenoglu H.

143rd TMS Annual Meeting & Exhibition, California, United States Of America, 16 - 20 February 2014, pp.379-381 identifier

  • Publication Type: Conference Paper / Full Text
  • City: California
  • Country: United States Of America
  • Page Numbers: pp.379-381

Abstract

The effects of deposition temperature on copper indium gallium diselenide Cu(In,Ga)Se-2 (CIGS) thin-film were examined to apply this layer in the CIGS solar cells. Electrical resistivity of CIGS layers was determined after CIGS thin films were deposited by sol-gel dip coating technique on substrates. The desired electrical resistivity is determined after annealing. The variations in electrical resistivity are investigated for the use in CIGS solar cells.