INVESTIGATION OF ELECTRICAL PROPERTIES OF CIGS THIN FILMS DERIVED BY SOL-GEL PROCESS

Baydogan N., Canci U., Akyol S., Cimenoglu H.

143rd TMS Annual Meeting & Exhibition, California, Amerika Birleşik Devletleri, 16 - 20 Şubat 2014, ss.379-381 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Basıldığı Şehir: California
  • Basıldığı Ülke: Amerika Birleşik Devletleri
  • Sayfa Sayıları: ss.379-381
  • İstanbul Teknik Üniversitesi Adresli: Evet

Özet

The effects of deposition temperature on copper indium gallium diselenide Cu(In,Ga)Se-2 (CIGS) thin-film were examined to apply this layer in the CIGS solar cells. Electrical resistivity of CIGS layers was determined after CIGS thin films were deposited by sol-gel dip coating technique on substrates. The desired electrical resistivity is determined after annealing. The variations in electrical resistivity are investigated for the use in CIGS solar cells.