66th Annual Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Minnesota, United States Of America, 19 - 22 October 1997, pp.246-249
The paper describes the determination of critical impulse breakdown voltage and standard deviation, using least squares method. The methods, given in the literature, are explained briefly. The least squares method is given in detail and a simple algorithm is introduced. The calculated values are very close to those given in the literature.