A GENERAL-MODEL FOR INTERFACE-TRAP CHARGE-PUMPING EFFECTS IN MOS DEVICES

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CILINGIROGLU U.

SOLID-STATE ELECTRONICS, vol.28, no.11, pp.1127-1141, 1985 (Journal Indexed in SCI)

• Publication Type: Article / Article
• Volume: 28 Issue: 11
• Publication Date: 1985
• Doi Number: 10.1016/0038-1101(85)90194-7
• Title of Journal : SOLID-STATE ELECTRONICS
• Page Numbers: pp.1127-1141