A GENERAL-MODEL FOR INTERFACE-TRAP CHARGE-PUMPING EFFECTS IN MOS DEVICES


CILINGIROGLU U.

SOLID-STATE ELECTRONICS, vol.28, no.11, pp.1127-1141, 1985 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 28 Issue: 11
  • Publication Date: 1985
  • Doi Number: 10.1016/0038-1101(85)90194-7
  • Title of Journal : SOLID-STATE ELECTRONICS
  • Page Numbers: pp.1127-1141