A GENERAL-MODEL FOR INTERFACE-TRAP CHARGE-PUMPING EFFECTS IN MOS DEVICES

Copy For Citation

CILINGIROGLU U.

SOLID-STATE ELECTRONICS, vol.28, no.11, pp.1127-1141, 1985 (SCI-Expanded)

• Publication Type: Article / Article
• Volume: 28 Issue: 11
• Publication Date: 1985
• Doi Number: 10.1016/0038-1101(85)90194-7
• Journal Name: SOLID-STATE ELECTRONICS
• Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
• Page Numbers: pp.1127-1141
• Istanbul Technical University Affiliated: No