Characterization investigations of a melt-spun ternary Al-8Si-5.1Cu (in wt.%) alloy


Ovecoglu M. L. , UNLU N., ERUSLU N., GENC A.

MATERIALS LETTERS, vol.57, no.21, pp.3296-3301, 2003 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 57 Issue: 21
  • Publication Date: 2003
  • Doi Number: 10.1016/s0167-577x(03)00051-x
  • Title of Journal : MATERIALS LETTERS
  • Page Numbers: pp.3296-3301

Abstract

A ternary Al-8Si-5.1Cu (in wt.%) alloy was rapidly quenched from the melt at cooling rates between 10(6) and 10(7) K/s using the melt-spinning technique. The resulting ribbons were characterized using optical microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD) and microhardness techniques. On the basis of the Al peak shifts measured in the XRD scans, a solid solubility extension value of 3.83 at.% Si in Al was determined. Whereas SEM investigations showed the presence of dendrites rich in Al, TEM investigations revealed nanosized spherically shaped Si crystals 20-25 mn in size. Both XRD and TEM investigations confirmed the absence of any intermetallic phase formation. The microhardness value of the melt-spun. alloy was measured as 201 kg/mm(2). (C) 2003 Elsevier Science B.V. All rights reserved.