Dynamical electrical tuning of a silicon microsphere: used for spectral mapping of the optical resonances


Yuce E., Gürlü O. , Thursby G. J. , Serpenguzel A.

APPLIED OPTICS, vol.53, no.27, pp.6181-6184, 2014 (Journal Indexed in SCI) identifier identifier

  • Publication Type: Article / Article
  • Volume: 53 Issue: 27
  • Publication Date: 2014
  • Doi Number: 10.1364/ao.53.006181
  • Title of Journal : APPLIED OPTICS
  • Page Numbers: pp.6181-6184

Abstract

In this work, electrical square pulses at various duty cycles are applied to a silicon microsphere resonator in order to continuously tune the refractive index of a silicon microsphere and to map the optical resonance in the time domain. A continuous-wave semiconductor diode laser operating in the L-band is used for the excitation of the silicon microsphere optical resonances. The 90 degrees transverse magnetically polarized elastic scattering signal is used to monitor the silicon microsphere resonances. We show that at a constant input laser wavelength, up to five high-quality-factor optical resonances can be scanned by dynamical electrical tuning of the silicon microsphere cavity. (C) 2014 Optical Society of America