Effect of Temperature and Film Thickness onResidual Stress and Microstructure of Er doped ZnO Thin Films

---

Copy For Citation

İPEK C., TOSUN M., BAYTAK T., BULUT O., DÖNMEZ A., ALPHAN M. C., ...More

Inernational Conference on Condensed Matter and Materials Science ICCMMS-2017, 11 - 15 October 2017

• Publication Type: Conference Paper / Summary Text
• Istanbul Technical University Affiliated: Yes