Effect of Temperature and Film Thickness onResidual Stress and Microstructure of Er doped ZnO Thin Films


İPEK C., TOSUN M., BAYTAK T. , BULUT O. , DÖNMEZ A., ALPHAN M. C. , ...More

Inernational Conference on Condensed Matter and Materials Science ICCMMS-2017, 11 - 15 October 2017

  • Publication Type: Conference Paper / Summary Text