A fast and robust scan matching algorithm based on feature dependent sampling

Ulas C., TEMELTAŞ H.

2011 9th IEEE International Conference on Control and Automation (ICCA), Santiago, Chile, 19 - 21 December 2011, pp.124-129

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/icca.2011.6137983
  • City: Santiago, Chile
  • Page Numbers: pp.124-129
  • Istanbul Technical University Affiliated: Yes