A rare event based yield estimation methodology for analog circuits

ODABAŞI I. Ç. , Yelten M. B. , AFACAN E., Baskaya F., Pusane A. E. , Dündar G.

21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018, Budapest, Hungary, 25 - 27 April 2018, pp.33-38 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/ddecs.2018.00013
  • City: Budapest
  • Country: Hungary
  • Page Numbers: pp.33-38