A rare event based yield estimation methodology for analog circuits

ODABAŞI I. Ç., Yelten M. B., AFACAN E., Baskaya F., Pusane A. E., Dündar G.

21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018, Budapest, Hungary, 25 - 27 April 2018, pp.33-38 identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/ddecs.2018.00013
  • City: Budapest
  • Country: Hungary
  • Page Numbers: pp.33-38
  • Istanbul Technical University Affiliated: Yes